ECU Libraries Catalog

Accelerated testing : statistical models, test plans and data analysis / Wayne Nelson.

Author/creator Nelson, Wayne, 1936-
Format Book and Print
Publication InfoNew York : Wiley, ©1990.
Descriptionxiv, 601 pages : illustrations ; 25 cm.
Subject(s)
Series Wiley series in probability and mathematical statistics. Applied probability and statistics
Wiley series in probability and mathematical statistics. Applied probability and statistics. ^A1552
General note"A Wiley-Interscience publication."
Bibliography noteIncludes bibliographical references (p. 561-577) and index.
LCCN 89024853
ISBN0471522775

Available Items

Library Location Call Number Status Item Actions
Joyner General Stacks QA276 .N45 1990 ✔ Available Place Hold